Welcome to Mitra Kencana Device
$6.880
Coating thickness measurement, based on X-ray fluorescence (XRF), is a widely accepted and industry proven analytical technique, offering easy to use, fast and non-destructive analysis, requiring little to no sample preparation, capable of analysing solids or liquids over a wide element range from 13Al to 92U on the periodic table. With superior resolution and high efficiency SDD, the MAXXI 6 is the ideal instrument for measuring the thinnest coatings and element composition at trace level.
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For consistent production and high product quality Coating thickness measurement, based on X-ray fluorescence (XRF), is a widely accepted and industry-proven analytical technique, offering easy to use, fast and non-destructive analysis, requiring little to no sample preparation, capable of analysing solids or liquids over a wide element range from 13Al to 92U on the periodic table. With superior resolution and high efficiency SDD, the MAXXI 6 is the ideal instrument for measuring the thinnest coatings and element composition at trace level.
Giant slotted chamber
Programmable stage
Software and calibration
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