Coating thickness measurement, based on X-ray fluorescence (XRF), is a widely accepted and industry proven analytical technique, offering easy to use, fast and non-destructive analysis, requiring little to no sample preparation, capable of analysing solids or liquids over a wide element range from 13Al to 92U on the periodic table.
With superior resolution and high efficiency SDD, the MAXXI 6 is the ideal instrument for measuring the thinnest coatings and element composition at trace level.